TESCAN produces a number of software solutions. The sophisticated control software is a standard part of every scanning electron microscope produced by TESCAN. There is also a standalone image processing software ATLAS. The software is modular with software extensions for various purposes.
Our aim from the beginning is to provide a customer software which will be intuitive and user-friendly for both professional or inexperienced microscopist. The current third generation of SEM microscopes is equipped with new software which is simple, transparent and even more intuitive.
The Atlas software is a standalone application for offline image processing of SEM images as well as a powerfull image grabber. Calibrated input from various devices like video microscopes, light microscopes with a digital camera, endoscopes, scanners etc. enables basic metrology applications.
There is a wide range of extension modules for the TESCAN SEM control software and for the ATLAS image processing software.
Particle Analysis has two versions: Particle Basic and Particle Advanced
The EasyEDX software modules provide an integration module for the OEM EasyEDX detector (it is included in the EasyEDX package as standard). However, the integration works with any Quantax EDX detector.
The Report generator is a standard feature contained in all TESCAN Scanning Electron Microscopes controlling software. This software tool allows a user to generate printable documents (reports). Stored images from SEM can be digestedly placed in the document with all information in the description.
The Image Manager is a standard feature included in all TESCAN Scanning Electron Microscopes controlling software. This software tool allows a user to browse, view or edit various images. You can view acquired images very simply without installing another image editor or browser. Images are processed with all information and parameters containing the header.
The Detectors & Mixer is a standard feature included in all TESCAN Scanning Electron Microscopes controlling software. The Detectors & Mixer panel serves for selection of appropriate detector installed and connected to SEM and for control of contrast/brightness levels. Access to desired detector suitable for concrete application is allowed from this panel.
The 3rd generation of TESCAN scanning electron microscopes is designed to fulfill all requirements of electron – and ion – beam lithography applications.
FIB tomography has become an important tool for studying materials at the micro and nanoscale. Unlike a single cross-section, this technique gives a better understanding of the volume distribution, 3D structure, and relationship between three-dimensional objects. TESCAN FIB-SEMs can be equipped with an optional software module 3D Tomography for automated data acquisition and reconstruction.
The AutoSlicer is a software module for TESCAN FIB-SEM systems. It provides an easy-to-use tool for automated sample preparation routines for the most common tasks like FIB cross section or TEM lamella preparation.
Correlative microscopy for Life Science
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