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Analytical X-Ray - X-Ray Transmission Fluorescence

Nanohunter II

Rigaku has announced the next generation Rigaku NANOHUNTER II benchtop total reflection X-ray fluorescence (TXRF) spectrometer that enables high-sensitivity ultra-trace elemental analysis, in liquids or on solid surfaces, to the parts-per-billion (ppb) level. Total reflection X-ray fluorescence spectroscopy is a method by which an incident beam of X-rays just grazes the sample, delivering low-background noise, high-sensitivity measurement of ultra-trace elements.

http://www.rigaku.com/en/node/6866

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