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Microscopy - MATERIAL SCIENCE - Electron Microscopy - Tescan
MAIA3 model 2016
The MAIA3 model 2016 is an ultra-high resolution SEM with excellent imaging capabilities in the whole range of beam energies.
A versatile detection system and high spatial resolution allow the observation of even the finest surface details. This is an essential feature for comprehensive characterization of nanomaterials, for observation of beam-sensitive samples common in the semiconductor industry and for comfortable imaging of non-conductive samples including uncoated biological specimens.