The TEM imaging platform iTEM is systematically oriented towards the requirements, needs, and workflows of the transmission microscopy field. iTEM sets a standard since years with enticingly simple, yet intuitive user operation.
One of ITEM’s distinguishing features is how easily it can be expanded by highly sophisticated software extensions. These extensions – called Solutions – extend iTEM’s range of functions for solving specific transmission microscopy tasks and enhance the application possibilities of your system.
The iTEM Solution Detection is based on sophisticated multi-phase particle detection which registers and analyzes thousands of image objects within seconds.
Electron tomography is a more widely known and versatile method for obtaining TEM sample information from the third dimension. This iTEM Solution Tomography feature enables you to obtain the desired results with the greatest of accuracy and reliability – and minimal user intervention.
Electron diffraction provides important information on the microstructure of crystalline materials. The iTEM Diffraction feature makes it possible to automatically index, evaluate, measure and analyze diffraction patterns of both single crystalline and polycrystalline samples.
iTEM Solution EFTEM offers acquisition, processing and evaluation routines for all prevailing methods of in-column energy-filtered electron microscopy, applicable for both Image EELS and ESI methods.
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