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10 Apr2019

Fabrication of micropillars using the TESCAN LYRA3 FIB-SEM

Researchers have conducted a study with the goal to expand the repertoire of nanomechanical testing methods for SRS measurements through the design of micropillar strain rate jump tests on nanocrystalline nickel. The micropillars for the studies conducted in this work were prepared using TESCAN LYRA3 gallium focused ion beam scanning electron microscope. 

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