Wirsam at Analytica Lab Africa 2019...
Wirsam Scientific attended Analytica Lab Africa 2019 where they exhibited their innovative products to new and existing ...Read More
Focused ion beam scanning electron microscopy (FIB-SEM) combines two beams (electron and ion) in one instrument. The SEM column provides high resolution imagi...Read More
Wirsam Scientific is proud to announce that one of it's long standing customers Johann Swanepoel from Just Pixels (Pty) LTD has won 3rd place in the Olympus Ima...Read More